Achivements
Registered patent
Patent No. 6842754 (February 25, 2021) Takayuki Uchihashi, Mikihiro Shibata, Tetsuyuki Kodera, "Scanning Probe Microscope"
Patent No. 6842158 (February 24, 2021) Takayuki Uchihashi, Come Adachi, Tetsuyuki Kodera, "Heating Holder and Probe Microscope"
Patent No. 6777310 (June 7, 2020) Tetsuyuki Kodera, Takahiro Toyoda, Takayuki Uchihashi, "Manufacturing method of chamber array"
Patent No. 5633089 (October 24, 2014) Toshio Ando, Yasutaka Okazaki, Takayuki Uchihashi, "Atomic Force Microscope and its Cantilever Support"
Patent No. 5277378 (May 31, 2013) Toshio Ando, Takayuki Uchihashi, Tetsuyuki Kodera, Tetsuro Yamamoto, "Scanning Probe Microscope"
Patent No. 5252389 (April 26, 2013) Toshio Ando, Takayuki Uchihashi, Hayato Yamashita "Scanning Probe Microscope" (High-speed phase measurement)
Patent No. 5164147 (December 28, 2012) Toshio Ando, Takayuki Uchihashi, Tetsuyuki Kodera, Hayato Yamashita "Scanning Probe Microscope and Cantilever Drive")
Patent No. 3448040 (July 4, 2003) Masatake Kishino, Haruhiko Yoshida, Takayuki Uchihashi "Semiconductor Wafer characterization Device and Its Usage")
Issued US Patents
No. US 7954165 B2 (May 31, 2011) Toshio Ando, Mitsuru Sakashita, Takayuki Uchihashi, "Scanning Probe Microscope" (Drift compensation method)
No. US 7958565 B2 (June 7, 2011) Toshio Ando, Takayuki Uchihashi, Noriyuki Kodera, Hayato Yamashita, "Scan type Probe Microcope and Cantilever Drive Device" (Laser driving of a cantilever and compensation method)
No. US 7975315 B2 (July 5, 2011) Toshio Ando, Takayuki Uchihashi, Noriyuki Kodera, Naohisa Takahashi, "Atomic Force Microscope" (Fast detection of resonator frequency shift of a cantilever)
Issued European Patents
EU Patent No.1898204 (September 12, 2018) Toshio Ando, Takayuki Uchihashi, Noriyuki Kodera, Hayato Yamashita, "Scan type Probe Microcope and Cantilever Drive Device" (Laser driving of a cantilever and compensation method)
EU Patent No.2063250 (September 5, 2018) Toshio Ando, Takayuki Uchihashi, Noriyuki Kodera, Naohisa Takahashi, "Atomic Force Microscope" (Fast detection of President frequency shift of a cantilever)
Domestic application
Takayuki Uchihashi, Mikihiro Shibata, Tetsuyuki Kodera, "Scanning Probe Microscope", Kanazawa University, December 1, 2016, Japanese Patent Application No. 2016-234584.
Takayuki Uchihashi, Come Adachi, Tetsuyuki Kodera, "Heating Holder and Probe Microscope", Kanazawa University, November 30, 2016, Japanese Patent Application No. 2016-233494.
Tetsuyuki Kodera, Takahiro Toyoda, Takayuki Uchihashi, "Manufacturing Method of Chamber Array", Kanazawa University, November 30, 2016, Japanese Patent Application No. 2016-232100.
Toshio Ando, Yasutaka Okazaki, Takayuki Uchihashi, "Atomic Force Microscope and Cantilever Support", Kanazawa University, June 1, 2010, Japanese Patent Application No. 2010-126027.
Toshio Ando, Takayuki Uchihashi, Tetsuyuki Kodera, Tetsuro Yamamoto, "Scanning Probe Microscope", Kanazawa University, Japanese Patent Application No. 2008-275981, October 27, 2008.
Toshio Ando, Takayuki Uchihashi, Tetsuyuki Kodera, Naohisa Takahashi, "Atomic Force Microscope", Kanazawa University, July 27, 2007, PCT / JP 2007/064732.
Toshio Ando, Takayuki Uchihashi, Hayato Yamashita, "Scanning Probe Microscope", Kanazawa University, December 12, 2006, PCT / JP2006 / 324723.
Toshio Ando, Mitsuru Sakashita, Takayuki Uchihashi, "Scanning Probe Microscope", Kanazawa University, October 12, 2006, PCT / JP2006 / 320415.
Toshio Ando, Takayuki Uchihashi, Tetsuyuki Kodera, Naohisa Takahashi, "Atomic Force Microscope", Kanazawa University, September 4, 2006, Japanese Patent Application No. 2006-238886.
Toshio Ando, Takayuki Uchihashi, Tetsuyuki Kodera and Hayato Yamashita, "Scanning Probe Microscope and Cantilever Drive", Kanazawa University, May 26, 2006, PCT / JP2006 / 310535.
Takayuki Uchihashi, Toshio Ando, Hayato Yamashita, "High-speed / high-sensitivity phase detection method and high-sensitivity high-speed AFM", Kanazawa University, December 20, 2005, Japanese Patent Application No. 2005-366395.
Toshio Ando, Mitsuru Sakashita, Takayuki Uchihashi, "Scanning Probe Microscope", Kanazawa University, December 19, 2005, Japanese Patent Application No. 2005-364797.
Toshio Ando, Takayuki Uchihashi, Tetsuyuki Kodera, Hayato Yamashita, "Scanning Probe Microscope and Cantilever Drive", Kanazawa University, May 31, 2005, Japanese Patent Application No. 2005-159910.
Overseas application
Toshio Ando, Takayuki Uchihashi, Tetsuyuki Kodera, Hayato Yamashita, "Scanning Probe Microscope and Cantilever Drive", Kanazawa University, December 19, 2007, 6756635.6 (Europe)
Toshio Ando, Takayuki Uchihashi, Tetsuyuki Kodera, Hayato Yamashita, "Scanning Probe Microscope and Cantilever Drive", Kanazawa University, November 29, 2007, 11 / 915,940 (USA)
Toshio Ando, Takayuki Uchihashi, Tetsuyuki Kodera, Naohisa Takahashi, "Atomic Force Microscope", Kanazawa University, July 27, 2007, PCT / JP 2007/064732.
Toshio Ando, Takayuki Uchihashi, Hayato Yamashita, "Scanning Probe Microscope", Kanazawa University, December 12, 2006, PCT / JP2006 / 324723.
Toshio Ando, Mitsuru Sakashita, Takayuki Uchihashi, "Scanning Probe Microscope", Kanazawa University, October 12, 2006, PCT / JP2006 / 320415.
Toshio Ando, Takayuki Uchihashi, Tetsuyuki Kodera, Hayato Yamashita, "Scanning Probe Microscope and Cantilever Drive", Kanazawa University, May 26, 2006, PCT / JP2006 / 310535.